Key features
- Quick and convenient switching between SEM and Raman measurement
- Automated sample transfer from one measuring position to the other
- Integrated software interface for user-friendly measurement control
- Correlation of the measurement results and image overlay
- No compromise in SEM and Raman imaging capabilities
- Raman microscopy provides analysis of chemical compounds and material characteristics (stress, orientation, crystallinity).
- Raman spectroscopy is a complementary method to EDX.
