TESCAN TENSOR is the world’s first dedicated 4D-STEM
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Multimodal characterization of nanoscale morphological, chemical, and structural properties of functional materials, thin films, and synthetic particles, with stand-out 4D-STEM performance and unprecedented usability.
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Synchronization of Scanning with Diffraction Imaging, EDS Acquisition and Beam Blanking.
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Integrated, Near Real-Time 4D-STEM data Analysis and Processing
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Performance benefits from Electron Beam Precession and near-UHV
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A novel approach to STEM User Experience
